V. Bondar, L. Grigorjeva, T. Kärner, O. Sidletskiy,
K. Smits, S. Zazubovich, A. Zolotarjovs
Thermally stimulated luminescence (TSL) characteristics (TSL glow curves and TSL
spectra) are investigated in the 4-520 K temperature range for the X-ray irradiated at 4 K, 8
K, or 80 K single crystals of gadolinium and lutetium-gadolinium oxyorthosilicates. The
nominally undoped Gd2SiO5 and (Lu,Gd)2SiO5 crystals, containing traces of Ce3+, Tb3+, and
Eu3+ ions, and Ce3+-doped Gd2SiO5 and (Lu,Gd)2SiO5 crystals are studied. For the first time,
the TSL glow curves of these materials are measured separately for the electron (intrinsic,
Ce3+- or Tb3+-related) and hole (Eu3+-related) recombination luminescence, and the TSL glow
curve peaks, arising from thermal decay of various electron and hole centers, are identified.
The origin of the traps related to the TSL peaks is discussed, and thermal stability parameters
of the electron and hole traps are calculated.
Journal of Luminescence